For Instructors

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Fig. 4.20. Flight tube passing through the gap of the magnetic sector of a JEOL JMS-700 instrument seen from the ESA side. The shapes of the pole pieces of the yoke and the additional blocks around the tube are designed to minimize fringing fields. In addition the pole faces are rotated to increase the mass range.

flight tube passes magnet of magnetic sector instrument

Fig. 4.27. Photograph of a JEOL JMS-700 double focusing magnetic sector instrument showing its BE geometry.

geometry of JMS-700 magnetic sector instrument

Fig. 4.57. Discrete dynode electron multiplier. Photograph of an old-fashioned 16-stage Venetian blind-type SEM. It clearly shows the resistors and ceramics insulators between the stacking dynodes at its side.

Venetian blind-type SEM

Fig. 4.59. Photograph of a channeltron multiplier.

channeltron detector

Fig. 5.8. EI/CI/FAB combination ion source of a JEOL JMS-700 sector instrument.

EI/CI/FAB combination ion source

Fig. 5.9. Filaments for EI/CI ion sources. A coiled filament of the VG ZAB-2F (left) and a straight wire filament of the JEOL JMS-700 (right). The shields behind the filament are at the same potential as the wire itself and the white parts are made of ceramics for insulation.

electron emitting filaments for EI and CI

Fig. 5.12. Tip of the DIP of a JEOL JMS-700 sector instrument for use with EI, chemical ionization (CI) and field ionization (FI). The copper probe tip holds the glass sample vial and is fitted to a temperature-controlled heater. The heater, a thermocouple, and circulation water cooling are provided inside. The (white) ceramics insulator protects the operator from the high voltage of the ion source.

EI/CI direct insertion probe tip

Fig. 5.14. Sample vials for different DIPs. From left: VG ZAB-2F, Finnigan TSQ700 glass and aluminum version, and JEOL JMS-700. The match illustrates the scale.

sample vials for EI/CI

Fig. 5.15. Sample vial filled with analyte. The bright spot halfway between the tip of the tweezers and upper rim of the vial is the piece of solid material to be analyzed. Use of more sample does not have any advantage; it only causes ion source contamination.

sample vial for EI/CI with sample

Fig. 5.18. Reservior inlet of a JEOL JMS-700 sector instrument with the septum injection port opened. The "operation valve" switches between evacuation, isolation and admission of the sample; a needle valve allows regulation of the sample flow. The GC transfer line crosses in the upper background from the GC (left) to the ion source housing (upper right).

reservoir inlet system
Fig. 9.3a. FAB probe of a JEOL JMS-700 magnetic sector instrument. The probe tip with a drop of glycerol placed onto the exchangeable stainless steel FAB target (below). FAB probe
Fig. 9.3b. FAB: probe tip with a drop of glycerol placed onto the exchangeable stainless steel FAB target (right). FAB probe loaded with glycerol
Fig. 9.14. FAB dual-target probe with handle for 180° axial turn to measure mass calibrant and analyte in alternating scans. The target can hold sample on both sides. FAB dual target probe
Fig. 8.7a. FD emitter holder of a JEOL FD probe. FD emitter mounted on probe
Fig. 8.7b. A drop formed of 1-2 µl analyte solution placed onto the activated emitter by means of a microliter syringe. drop of solution on FD emitter
Fig. 8.8. FD probe inserted into the vacuum lock. FD probes are generally inserted in axial position to leave the vacuum lock of the DIP free for FI use. The emitter wire is now oriented vertically to comply with the beam geometry of the magnetic sector analyzer. FD ion source mounted to magnetic sector instrument
Fig. 10.9a. Bruker Scout26 MALDI target with some sample preparations using different matrices. Scout26 MALDI target with sample preparations

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Monday, January 17, 2011